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13 Chapter 13Figure 13.1 Shows such an equipment for statistical analysis of failure of f...Figure 13.2 Shows an optical image of such a test board having four chips on...Figure 13.3 The layout of the solder joints between the chip and the board i...Figure 13.4 Is a schematic diagram to illustrate the idea of lattice shift....Figure 13.5 Shows the Weibull distribution plots of time to failure of a set...Figure 13.6 All the failures showed a rather flat resistance change with tim...Figure 13.7 (a) and (b) show the failure site images of the sample failed in...Figure 13.8 (a) It shows that the location of RDL in the sample is near the ...Figure 13.9 Simulation result in three different stressing conditions, from ...Figure 13.10 (a) Cross‐sectional SEM image showing the test sample, (b) Top ...Figure 13.11 In the test structure, there are two Si chips placed horizontal...

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